Engineered for Reliability
The Racal Instruments™ 1830 Source/Measure Switch forms the core of modern functional test systems used in manufacturing, burn-in, and other applications. The LXI Class C interface simplifies connectivity by using a standard Ethernet port. GPIB and USB ports are also provided for easy integration into any functional test system. The optional high-reliability switch modules offer extended lifetime and increased system uptime with-up to one million cycles per channel at half-rated power.
At the core of the 1830, the multi-lane Signal Raceway analog bus simplifies cabling, preserves signal integrity, and enables tight integration between switching and test instruments. Connections to internal instruments, matrix expansion, and multiplexer expansion are all provided internally along the raceway without the need for external wiring or loopbacks that are common in PXI or VXI systems.
The 1830's parallel architecture enables high-throughput with up to four (4) factory-installed instruments simultaneously measuring multiple signals on multiple Units Under Test (UUTs). The nine (9) user-accessible expansion slots provide over 500 multiplexed channels enabling a high-volume, compact test system for manufacturing or a high-channel count test system with time-correlated measurements for burn-in.